Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 6, 583(2025)

Study on the uniformity of cable insulation layer thickness using terahertz pulse imaging

CHEN Siyang1, CHENG Cheng1, and ZHAI Di2
Author Affiliations
  • 1State grid Ningxia Ultrahigh Voltage Company, Yingchuan Ningxia 750011, China
  • 2State Grid Smart Grid Research Institute Co., Ltd, Beijing 102209, China
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    CHEN Siyang, CHENG Cheng, ZHAI Di. Study on the uniformity of cable insulation layer thickness using terahertz pulse imaging[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(6): 583

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    Paper Information

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    Received: Oct. 15, 2024

    Accepted: Jul. 30, 2025

    Published Online: Jul. 30, 2025

    The Author Email:

    DOI:10.11805/tkyda2024558

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