Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 6, 583(2025)

Study on the uniformity of cable insulation layer thickness using terahertz pulse imaging

CHEN Siyang1, CHENG Cheng1, and ZHAI Di2
Author Affiliations
  • 1State grid Ningxia Ultrahigh Voltage Company, Yingchuan Ningxia 750011, China
  • 2State Grid Smart Grid Research Institute Co., Ltd, Beijing 102209, China
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    The quality of the insulation layer of high-voltage cables is crucial for the long-term reliability of power transmission and transformation systems. Non-uniformity in the thickness of the insulation layer can lead to localized tangential electric fields, which are prone to creating safety hazards. A reflective terahertz detection system, combined with a cylindrical coordinate scanning device, is employed to achieve full-angle scanning measurements of the insulation layer thickness of cross-linked polyethylene high-voltage cables. The non-roundness of the insulation layer thickness is quantified, and its distribution uniformity is assessed. The terahertz images intuitively display the interface wrinkle texture features of the insulation layer, which are highly consistent with the actual specimen morphology. This validates the effectiveness of terahertz imaging technology in the quality inspection of high-voltage cables, providing a new detection method and evaluation approach for the quality assessment of high-voltage cables.

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    CHEN Siyang, CHENG Cheng, ZHAI Di. Study on the uniformity of cable insulation layer thickness using terahertz pulse imaging[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(6): 583

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    Paper Information

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    Received: Oct. 15, 2024

    Accepted: Jul. 30, 2025

    Published Online: Jul. 30, 2025

    The Author Email:

    DOI:10.11805/tkyda2024558

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