Chinese Journal of Lasers, Volume. 47, Issue 10, 1003001(2020)

Effect of Anionic Modified Polishing Agent on Nd-Doped Phosphate Laser Glass Polishing

Liu Boxun1,2,3, Jiao Xiang2,3, Tan Xiaohong2,3, and Zhu Jianqiang1,2,3、*
Author Affiliations
  • 1School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China
  • 2National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • show less
    References(15)

    [1] Nichols M A. Summary of synthetic lap polishing experiments at LLNL. [C]∥3rd American Precision Optical Manufacturer's Association Optical Fabrication Workshop, November 5-6, 2001, Rochester. [S. l.]: [s. n.], 1-10(2001).

    [4] Rambo P, Schwarz J, Kimmel M et al. Development of high damage threshold laser-machined apodizers and gain filters for laser applications[J]. High Power Laser Science and Engineering, 4, e32(2016).

    [6] Peedikakkandy L, Kalita L, Kavle P et al. Preparation of spherical ceria coated silica nanoparticle abrasives for CMP application[J]. Applied Surface Science, 357, 1306-1312(2015).

    [8] Jones R A. Optimization of computer controlled polishing[J]. Applied Optics, 16, 218-224(1977).

    [9] Schindler A, Hänsel T, Frost F et al. Ion beam finishing technology for high precision optics production. [C]∥Optical Fabrication and Testing, Tucson, Arizona. Washington, D.C.: OSA, 1-3(2002).

    [10] Hedrick J B[J]. Sinha S P. Cerium-based polishing compounds: discovery to manufacture. Journal of Alloys, Compounds, 207/208, 377-382(1994).

    [12] DeGroote J, Jacobs S D, Gregg L L et al. A data base for the physical properties of optical polishing pitch. [C]∥Optical Fabrication and Testing, Tucson, Arizona. Washington, D.C.: OSA, 55-59(2002).

    [13] Xie Y S, Bhushan B. Effects of particle size, polishing pad and contact pressure in free abrasive polishing[J]. Wear, 200, 281-295(1996).

    [15] Asghar K, Qasim M, Nelabhotla D M et al. Effect of surfactant and electrolyte on surface modification of c-plane GaN substrate using chemical mechanical planarization (CMP) process[J]. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 497, 133-145(2016).

    Tools

    Get Citation

    Copy Citation Text

    Liu Boxun, Jiao Xiang, Tan Xiaohong, Zhu Jianqiang. Effect of Anionic Modified Polishing Agent on Nd-Doped Phosphate Laser Glass Polishing[J]. Chinese Journal of Lasers, 2020, 47(10): 1003001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: materials and thin films

    Received: Apr. 3, 2020

    Accepted: --

    Published Online: Oct. 9, 2020

    The Author Email: Jianqiang Zhu (jqzhu@mail.shcnc.ac.cn)

    DOI:10.3788/CJL202047.1003001

    Topics