Effect of Anionic Modified Polishing Agent on Nd-Doped Phosphate Laser Glass Polishing

Liu Boxun; Jiao Xiang; Tan Xiaohong; Zhu Jianqiang

doi:10.3788/CJL202047.1003001

Chinese Journal of Lasers, Volume. 47, Issue 10, 1003001(2020)

Effect of Anionic Modified Polishing Agent on Nd-Doped Phosphate Laser Glass Polishing

Liu Boxun^1,2,3, Jiao Xiang^2,3, Tan Xiaohong^2,3, and Zhu Jianqiang^1,2,3、*

Author Affiliations

¹School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China

²National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

³National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China

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Figures & Tables(6)

Fig. 1. Median particle diameter d₅₀ of ceria abrasives in polishing slurry

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$Effect of mass fraction of Lamepon A on material removal rate$

Fig. 2. Effect of mass fraction of Lamepon A on material removal rate

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$Effect of mass fraction of Lamepon A on surface roughness of Nd-glass$

Fig. 3. Effect of mass fraction of Lamepon A on surface roughness of Nd-glass

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$Polishing quality of Nd-glass with different mass fraction of Lamepon A. (a) 0; (b) 0.20%; (c) 0.35%$

Fig. 4. Polishing quality of Nd-glass with different mass fraction of Lamepon A. (a) 0; (b) 0.20%; (c) 0.35%

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Fig. 5. Effect of pH of polishing slurry on material removal rate

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Fig. 6. Effect of pH of polishing slurry on surface roughness

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Liu Boxun, Jiao Xiang, Tan Xiaohong, Zhu Jianqiang. Effect of Anionic Modified Polishing Agent on Nd-Doped Phosphate Laser Glass Polishing[J]. Chinese Journal of Lasers, 2020, 47(10): 1003001

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Paper Information

Category: materials and thin films

Received: Apr. 3, 2020

Accepted: --

Published Online: Oct. 9, 2020

The Author Email: Jianqiang Zhu (jqzhu@mail.shcnc.ac.cn)

DOI:10.3788/CJL202047.1003001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology