A Key Measurement Technique of High Speed ADC

ZHANG Lin; QI Feitao; LIU Tao; ZHU Beili; LIU Hainan; TENG Rui; LI Bo; ZHAO Fazhan; LUO Jiajun; HAN Zhengsheng

doi:10.13911/j.cnki.1004-3365.zjea015

Microelectronics, Volume. 52, Issue 2, 334(2022)

A Key Measurement Technique of High Speed ADC

ZHANG Lin^1,2, QI Feitao^1,2, LIU Tao^1,2, ZHU Beili^1,2, LIU Hainan^1,2, TENG Rui^1,2, LI Bo^1,2, ZHAO Fazhan^1,2, LUO Jiajun^1,2, and HAN Zhengsheng^1,2,3

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¹[in Chinese]

²[in Chinese]

³[in Chinese]

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References(6)

[1] [1] 1241-2010, IEEE standard for terminology and test methods for analog-to-digital converters ［S］. IEEE, 2011.

[2] [2] PETRICEVIC S J, MIHAILOVIC P, BARJAKTAROVIC M, et al. High input impedance ADC driver with error compensation ［C］// 29th MIEL. Belgrade, Serbia. 2014: 463-465.

[3] [3] ZHOU G, WU J. Hardware design of data acquisition and processing of digital IF receiver ［C］// CECNet. Yichang, China. 2012: 2613-2615.

[4] [4] PAWAR R R, WAGH P A, DEOSARKAR S B. Distribution transformer monitoring system using internet of things ［C］// ICCIDS. Chennai, India. 2017: 1-4.

[5] [5] ZHANG Q, CHEN Y Z, SU Y, et al. A testing system for high speed multi-channel ADC with LVDS data output based on FPGA ［C］// ICSICT. Guilin, China. 2014: 1-3.

[6] [6] BI S J, LV Y X. Analysis of sampling clock jitter effect on the SNR of two RF sampling receivers ［C］// ICCP. Jiuzhai, China. 2013: 394-397.

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ZHANG Lin, QI Feitao, LIU Tao, ZHU Beili, LIU Hainan, TENG Rui, LI Bo, ZHAO Fazhan, LUO Jiajun, HAN Zhengsheng. A Key Measurement Technique of High Speed ADC[J]. Microelectronics, 2022, 52(2): 334

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Paper Information

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Received: Jan. 27, 2022

Accepted: --

Published Online: Jan. 16, 2023

The Author Email:

DOI:10.13911/j.cnki.1004-3365.zjea015

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology