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Microelectronics, Volume. 52, Issue 2, 334(2022)

A Key Measurement Technique of High Speed ADC

ZHANG Lin1,2, QI Feitao1,2, LIU Tao1,2, ZHU Beili1,2, LIU Hainan1,2, TENG Rui1,2, LI Bo1,2, ZHAO Fazhan1,2, LUO Jiajun1,2, and HAN Zhengsheng1,2,3
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  • 1[in Chinese]
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  • 3[in Chinese]
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    ZHANG Lin, QI Feitao, LIU Tao, ZHU Beili, LIU Hainan, TENG Rui, LI Bo, ZHAO Fazhan, LUO Jiajun, HAN Zhengsheng. A Key Measurement Technique of High Speed ADC[J]. Microelectronics, 2022, 52(2): 334

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    Received: Jan. 27, 2022

    Accepted: --

    Published Online: Jan. 16, 2023

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    DOI:10.13911/j.cnki.1004-3365.zjea015

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology