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Chinese Optics Letters, Volume. 13, Issue 4, 041407(2015)

Postprocessing treatments to improve the laser damage resistance of fused silica optical surfaces and SiO2 coatings

Wenwen Liu1,2, Chaoyang Wei1、*, Kui Yi1, and Jianda Shao1
Author Affiliations
  • 1Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Graduate School of Chinese Academy of Sciences, Beijing 100039, China
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    [1] Chong Shan, Yuanan Zhao, Yanqi Gao, Xiaohui Zhao, Guohang Hu, Weixin Ma, Jianda Shao, "Laser-induced defects in optical multilayer coatings by the spatial resolved method," Chin. Opt. Lett. 17, 031403 (2019)

    [2] Yangliang Li, Chao Shen, Li Shao, Yujun Zhang, "Dynamic image acquisition and particle recognition of laser-induced exit surface particle ejection in fused silica," Chin. Opt. Lett. 17, 101402 (2019)

    [3] Chen Li, Yongying Yang, Huiting Chai, Yihui Zhang, Fan Wu, Lin Zhou, Kai Yan, Jian Bai, Yibing Shen, Qiao Xu, Hongzhen Jiang, Xu Liu, "Dark-field detection method of shallow scratches on the super-smooth optical surface based on the technology of adaptive smoothing and morphological differencing," Chin. Opt. Lett. 15, 081202 (2017)

    Cited By

    [8] Yingjie Chai, Meiping Zhu, Hu Wang, Huanbin Xing, Yun Cui, Jian Sun, Kui Yi, Jianda Shao. Laser-resistance sensitivity to substrate pit size of multilayer coatings. Scientific Reports, 6(2016).

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    Wenwen Liu, Chaoyang Wei, Kui Yi, Jianda Shao, "Postprocessing treatments to improve the laser damage resistance of fused silica optical surfaces and SiO2 coatings," Chin. Opt. Lett. 13, 041407 (2015)

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Nov. 27, 2014

    Accepted: Feb. 12, 2015

    Published Online: Sep. 21, 2018

    The Author Email: Chaoyang Wei (siomwei@siom.ac.cn)

    DOI:10.3788/COL201513.041407

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology