Laser & Optoelectronics Progress, Volume. 60, Issue 3, 0312018(2023)

Research on Reflective Two-Dimensional Grating Measurement System

Hongzhong Liu1,2、*, Yongsheng Shi1,2, Lei Yin1,2, Bangdao Chen1,2, Biao Lei1,2, Weitao Jiang1,2, Dong Niu1,2, Lanlan Wang1,2, Wei Jiang1,2, Guojun Li1,2, and Jinju Chen3
Author Affiliations
  • 1State Key Laboratory for Manufacturing Systems Engineering, Xi'an 710049, Shaanxi, China
  • 2School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China
  • 3School of Engineering, Newcastle University, Newcastle NE1 7RU, UK
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    Figures & Tables(11)
    Optical path of reflection gratings measurement based on Tablot imaging principle. (a) Scheme of Talbot imaging; (b) scheme of optical path for reflective grating measurement
    Optical path of plane reflection grating measuring system
    Interpolation error induced by the signal waveform error. (a) Single error; (b) multiple error synthesis
    Flow chart of real time correction of grating signal error
    Basic principle of the grating signal correction
    Hardware configuration for the grating dynamic measurement system
    Establishment of experimental platform for grating dynamic measurement system
    Interpolation error curve within a period
    Long-stroke measurement error curve. (a) In x direction; (b) in y direction
    Grating dynamic measurement curve under uniform motion. (a) Velocity curve; (b) acceleration curve
    Grating dynamic measurement curve under reciprocating motion. (a) Velocity curve; (b) acceleration curve
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    Hongzhong Liu, Yongsheng Shi, Lei Yin, Bangdao Chen, Biao Lei, Weitao Jiang, Dong Niu, Lanlan Wang, Wei Jiang, Guojun Li, Jinju Chen. Research on Reflective Two-Dimensional Grating Measurement System[J]. Laser & Optoelectronics Progress, 2023, 60(3): 0312018

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 20, 2022

    Accepted: Dec. 5, 2022

    Published Online: Feb. 14, 2023

    The Author Email: Hongzhong Liu (hzliu@mail.xjtu.edu.cn)

    DOI:10.3788/LOP222844

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