Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0611001(2025)

Ultrasonic Phased Array Technology for Defect Imaging and Classification Using PCI-SVM

Haoqian Zhang1、* and Kai Zhao1,2
Author Affiliations
  • 1School of Mechanical Engineering, Jiangnan University, Wuxi 214122, Jiangsu , China
  • 2Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment Technology, Wuxi 214122, Jiangsu , China
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    References(18)

    [12] Li Z H, Fang F Z, Ren Z H et al. Polished surface defect detection based on intelligent surface analysis[J]. Laser & Optoelectronics Progress, 60, 2412006(2023).

    [16] Wang H. Research on few-shot image recognition technology based on data augmentation and metric learning[D], 33-75(2022).

    [18] Deng G W, You H Q, Zhu Z S. Defect detection on aluminum profile surface based on KCC-YOLOv5[J]. Laser & Optoelectronics Progress, 61, 0412002(2024).

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    Haoqian Zhang, Kai Zhao. Ultrasonic Phased Array Technology for Defect Imaging and Classification Using PCI-SVM[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0611001

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    Paper Information

    Category: Imaging Systems

    Received: Jun. 20, 2024

    Accepted: Aug. 1, 2024

    Published Online: Mar. 12, 2025

    The Author Email:

    DOI:10.3788/LOP241523

    CSTR:32186.14.LOP241523

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