Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0611001(2025)
Ultrasonic Phased Array Technology for Defect Imaging and Classification Using PCI-SVM
[12] Li Z H, Fang F Z, Ren Z H et al. Polished surface defect detection based on intelligent surface analysis[J]. Laser & Optoelectronics Progress, 60, 2412006(2023).
[16] Wang H. Research on few-shot image recognition technology based on data augmentation and metric learning[D], 33-75(2022).
[18] Deng G W, You H Q, Zhu Z S. Defect detection on aluminum profile surface based on KCC-YOLOv5[J]. Laser & Optoelectronics Progress, 61, 0412002(2024).
Get Citation
Copy Citation Text
Haoqian Zhang, Kai Zhao. Ultrasonic Phased Array Technology for Defect Imaging and Classification Using PCI-SVM[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0611001
Category: Imaging Systems
Received: Jun. 20, 2024
Accepted: Aug. 1, 2024
Published Online: Mar. 12, 2025
The Author Email:
CSTR:32186.14.LOP241523