Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0611001(2025)

Ultrasonic Phased Array Technology for Defect Imaging and Classification Using PCI-SVM

Haoqian Zhang1、* and Kai Zhao1,2
Author Affiliations
  • 1School of Mechanical Engineering, Jiangnan University, Wuxi 214122, Jiangsu , China
  • 2Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment Technology, Wuxi 214122, Jiangsu , China
  • show less
    Figures & Tables(13)
    Schematic diagram of the total focusing imaging method
    Schematic diagram of support vector machine
    Schematic diagrams of defects. (a) Aluminum test piece with pitting corrosion; (b) aluminum test piece with cracks
    Defect images. (a) TFM image with pitting; (b) TFM image with cracks; (c) PCI image with pitting; (d) PCI image with cracks
    Phase information diagrams of No.4 pitting defect in width direction. (a) Phase value; (b) phase value difference
    Horizontal amplitudes at different depths in images containing pitting and crack defects. (a) 400 mm (pitting); (b) 600 mm (pitting); (c) 400 mm (crack); (d) 460 mm (crack)
    Enhanced dataset
    HOG feature map. (a) Original image; (b) HOG feature map
    Accuracy of SVM image defect classification under different kernel functions. (a) Different dataset types; (b) before and after data enhancement
    • Table 1. Phased array parameter setting

      View table

      Table 1. Phased array parameter setting

      Number of elementsExcitation frequency /MHz

      Element

      width /mm

      Element

      spacing /mm

      Speed of

      sound /(m/s)

      Crossover probabilityMutation probability
      3250.9163000.050.05
    • Table 2. Signal-to-noise ratio of various pitting defects

      View table

      Table 2. Signal-to-noise ratio of various pitting defects

      Defect12345
      Improvement rate /%53.3196.58108.5669.9393.90
      TFM_SNR /dB17.6920.4919.9726.4724.77
      PCI_SNR /dB27.1240.2841.6544.9848.03
    • Table 3. Signal-to-noise ratio of each crack defect

      View table

      Table 3. Signal-to-noise ratio of each crack defect

      Defect12345
      Improvement rate /%149.96104.7993.1098.5881.12
      TFM_SNR /dB23.4023.8219.8521.8123.47
      PCI_SNR /dB58.4948.7838.3343.3142.51
    • Table 4. Evaluation performance indicators

      View table

      Table 4. Evaluation performance indicators

      SVMPrecision /%Recall /%F1-score /%Accuracy /%
      SVM of pitting data9010094.794.6
      SVM of crack data10089.394.4
    Tools

    Get Citation

    Copy Citation Text

    Haoqian Zhang, Kai Zhao. Ultrasonic Phased Array Technology for Defect Imaging and Classification Using PCI-SVM[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0611001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Imaging Systems

    Received: Jun. 20, 2024

    Accepted: Aug. 1, 2024

    Published Online: Mar. 12, 2025

    The Author Email:

    DOI:10.3788/LOP241523

    CSTR:32186.14.LOP241523

    Topics