Journal of Applied Optics, Volume. 46, Issue 2, 380(2025)

Method of detecting microlens wavefront by Hartmann sensor

Weibin YANG1, Chunyan WANG1、*, Weiguo ZHANG2, Jinyu WANG2, Liangping XIA3,4, Chunlei DU3,4, and Hao SUN1
Author Affiliations
  • 1School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • 2Research Center for Micro and Nano Manufacturing and System Integration, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, China
  • 3Key Laboratory of Micro-Nano Optoelectronic Devices and Intelligent Sensing System, Yangtze Normal University, Chongqing 408100, China
  • 4Zhuhai Mai Time Electronics Technology Co.,Ltd., Zhuhai 519060, China
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    Figures & Tables(12)
    Optical path diagram of overall scheme for test system
    Error diagram of spot centroid extraction
    Centroid offset diagrams
    Wavefront restoration diagrams
    Test experiment site
    Experimental spot diagrams
    Wavefront aberration diagram
    Primary aberration diagrams of lens
    • Table 1. Reconstruction errors of different orders of Zernike polynomial

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      Table 1. Reconstruction errors of different orders of Zernike polynomial

      多项式阶次121518212836
      RMS/λ0.062 00.0510.050 30.048 00.049 20.047 0
      PV/λ0.097 80.0820.083 00.08140.079 60.076 5
    • Table 2. Influence of sampling numbers on fitting errors

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      Table 2. Influence of sampling numbers on fitting errors

      采样点数170276431585679
      RMS/λ0.0810.062 00.051 30.047 00.046 8
      PV/λ0.1020.096 80.083 30.076 50.076 6
    • Table 3. Zernike coefficients of lens under test

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      Table 3. Zernike coefficients of lens under test

      Zernike系数Z1Z2Z3Z4Z5Z6Z7Z8Z9
      计算结果−0.006−0.108 9−0.070 60.010 90.062 20.008 20.015 40.013 4−0.001
      Zernike系数Z10Z11Z12Z13Z14Z15Z16Z17Z18
      计算结果−0.009 4−0.002 1−0.002 2−0.010 60.005−0.002 5−0.001 80.001 80.002
      Zernike系数Z19Z20Z21Z22Z23Z24Z25Z26Z27
      计算结果0.000 2−0.002 8−0.000 20.000 60.0070.0090.001 5−0.0010.001 3
      Zernike系数Z28Z29Z30Z31Z32Z33Z34Z35Z36
      计算结果0.000 4−0.0010.001 6−0.000 20.000 30.000 50.000 70.000 2−0.001 7
    • Table 4. List of aberrations of microlenses to be tested

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      Table 4. List of aberrations of microlenses to be tested

      像差离焦0°像散45°像散X方向彗 差和倾斜
      大小/μm0.010 90.062 20.008 20.015 4
      像差Y方向彗 差和倾斜球差和离焦0°三叶像散
      大小/μm0.013 4−0.001−0.009 4
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    Weibin YANG, Chunyan WANG, Weiguo ZHANG, Jinyu WANG, Liangping XIA, Chunlei DU, Hao SUN. Method of detecting microlens wavefront by Hartmann sensor[J]. Journal of Applied Optics, 2025, 46(2): 380

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    Paper Information

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    Received: Feb. 1, 2024

    Accepted: --

    Published Online: May. 13, 2025

    The Author Email: Chunyan WANG (王春艳)

    DOI:10.5768/JAO202546.0203003

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