NUCLEAR TECHNIQUES, Volume. 47, Issue 3, 030402(2024)

Neutron and gamma performance testing of silicon carbide semiconductor detectors

Haining SHI1,2、*, Hong YING1,2, Tao ZHANG1,2, Tang TANG1,2, Jinlin SONG3, Pin GONG3, and Xiaobin TANG3
Author Affiliations
  • 1China General Nuclear Power Group, Suzhou Nuclear Power Research Institute, Suzhou 215004, China
  • 2National Engineering Research Center for Nuclear Power Plant Safety & Reliability, Suzhou 215004, China
  • 3Department of Nuclear Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China
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    References(14)

    [9] JIANG Yong, LI Junjie, ZHENG Chun et al. Performance measurement of aurum-silicon surface barrier detector in 6LiF sandwich semiconductor spectrometer[J]. Nuclear Power Engineering, 29, 94-97(2008).

    [13] LUO Hailong, LIU Yina, WANG Zhiqiang et al. Comparison of response with different background subtracting methods in neutron dosemeter calibration[J]. Radiation Protection, 32, 273-276(2012).

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    Haining SHI, Hong YING, Tao ZHANG, Tang TANG, Jinlin SONG, Pin GONG, Xiaobin TANG. Neutron and gamma performance testing of silicon carbide semiconductor detectors[J]. NUCLEAR TECHNIQUES, 2024, 47(3): 030402

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    Paper Information

    Category: Research Articles

    Received: May. 9, 2023

    Accepted: --

    Published Online: Apr. 29, 2024

    The Author Email: Haining SHI (shihaining@cgnpc.com.cn)

    DOI:10.11889/j.0253-3219.2024.hjs.47.030402

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