NUCLEAR TECHNIQUES, Volume. 47, Issue 3, 030402(2024)
Neutron and gamma performance testing of silicon carbide semiconductor detectors
Figures & Tables(11)
Fig. 1. Schematic diagram of SiC semiconductor detector structure (a) and physical image (b)
Fig. 2. Relationship between thermal neutron detection efficiency and different thicknesses of 6LiF
Table 1. Counting rates of neutron detector in different reference points
View tableView in ArticleTable 1. Counting rates of neutron detector in different reference points
中子注量率约定真值
Agreed true value of neutron
fluence rate / cm-2∙s-1
、待测仪器计数率
Counting rate of the
instrument to be tested / s-1
、2.14×106 3 490 2.27×105 542 3.62×104 233 1.40×104 90 2.99×103 18 6.08×102 4
Table 2. Counting rates of gamma detector in different reference points
View tableView in ArticleTable 2. Counting rates of gamma detector in different reference points
参考点及不确定度(k=2)
Reference points / (Gy∙h-1) and uncertainty (k=2) / %
、探测器计数率
Counting rate of detector / s-1
、校准因子
Calibration factor / Gy∙h-1∙s-1
、0.005 (3) 41 0.000 121 0.01 (1) 96 0.000 104 0.03 (1) 291 0.000 103 0.1 (1) 901 0.000 111 0.5 (1) 4 459 0.000 112 3 (1.7%) 25 587 0.000 117 5.54 (1.7%) 32 805 0.000 169 7 (1.7%) 34 207 0.000 205 10 (1.7%) 35 717 0.000 280 12 (1.7%) 36 636 0.000 328 20 (1.7%) 38 185 0.000 524
Tools
Get Citation
Copy Citation Text
Haining SHI, Hong YING, Tao ZHANG, Tang TANG, Jinlin SONG, Pin GONG, Xiaobin TANG. Neutron and gamma performance testing of silicon carbide semiconductor detectors[J]. NUCLEAR TECHNIQUES, 2024, 47(3): 030402
Paper Information
Category: Research Articles
Received: May. 9, 2023
Accepted: --
Published Online: Apr. 29, 2024
The Author Email: SHI Haining (shihaining@cgnpc.com.cn)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20