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Laser & Optoelectronics Progress, Volume. 59, Issue 2, 0210003(2022)

Simultaneous Localization and Mapping Based on Point and Line Feature Matching

Yunduo Li1,2, Jin Che1,2、*, and Cheng Xue1,2
Author Affiliations
  • 1School of Physics and Electronic-Electrical Engineering, Ningxia University, Yinchuan , Ningxia 750021, China
  • 2Ningxia Key Laboratory of Intelligent Sensing for Desert Information, Ningxia University, Yinchuan , Ningxia 750021, China
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    Article index updated: Sep. 11, 2025

    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
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    Yunduo Li, Jin Che, Cheng Xue. Simultaneous Localization and Mapping Based on Point and Line Feature Matching[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0210003

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    Paper Information

    Category: Image Processing

    Received: Feb. 3, 2021

    Accepted: Mar. 9, 2021

    Published Online: Dec. 23, 2021

    The Author Email: Jin Che (koalache@126.com)

    DOI:10.3788/LOP202259.0210003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology