Chinese Journal of Lasers, Volume. 12, Issue 3, 177(1985)

Measurement of parameters of absorbing thin film with phase-modulation laser interferometer

Wei Zhiyuan, Yan Zhanggen, and Wu Zhongxin
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  • [in Chinese]
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    References(4)

    [1] [1] P. S. Hauga et al.; IBMJ, Res. Develop, 1974, 17, 472.

    [4] [4] J. Shamir et al.; Appl. Opt., 1975, 14, 5053.

    [5] [5] J. Shamir; Appl. Opt.1976, 15, No. 1, 120

    [6] [6] Y. Domnor et al.; Appl. Opt.,1978,11, No. 23,3738.

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    Wei Zhiyuan, Yan Zhanggen, Wu Zhongxin. Measurement of parameters of absorbing thin film with phase-modulation laser interferometer[J]. Chinese Journal of Lasers, 1985, 12(3): 177

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    Paper Information

    Category: laser devices and laser physics

    Received: Jan. 23, 1984

    Accepted: --

    Published Online: Sep. 4, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

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