Chinese Journal of Lasers, Volume. 12, Issue 3, 177(1985)
Measurement of parameters of absorbing thin film with phase-modulation laser interferometer
[1] [1] P. S. Hauga et al.; IBMJ, Res. Develop, 1974, 17, 472.
[4] [4] J. Shamir et al.; Appl. Opt., 1975, 14, 5053.
[5] [5] J. Shamir; Appl. Opt.1976, 15, No. 1, 120
[6] [6] Y. Domnor et al.; Appl. Opt.,1978,11, No. 23,3738.
Get Citation
Copy Citation Text
Wei Zhiyuan, Yan Zhanggen, Wu Zhongxin. Measurement of parameters of absorbing thin film with phase-modulation laser interferometer[J]. Chinese Journal of Lasers, 1985, 12(3): 177
Category: laser devices and laser physics
Received: Jan. 23, 1984
Accepted: --
Published Online: Sep. 4, 2012
The Author Email:
CSTR:32186.14.