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Chinese Journal of Lasers, Volume. 12, Issue 3, 177(1985)

Measurement of parameters of absorbing thin film with phase-modulation laser interferometer

Wei Zhiyuan, Yan Zhanggen, and Wu Zhongxin
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    Wei Zhiyuan, Yan Zhanggen, Wu Zhongxin. Measurement of parameters of absorbing thin film with phase-modulation laser interferometer[J]. Chinese Journal of Lasers, 1985, 12(3): 177

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    Paper Information

    Category: laser devices and laser physics

    Received: Jan. 23, 1984

    Accepted: --

    Published Online: Sep. 4, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology