Electronics and Packaging, Volume. 25, Issue 7, 70103(2025)

Regulation Study of Stress Buffer Layer on the Internal Stress and Reliability of Glass Substrate Hole-Filling Structures

WANG Zhanbo, ZHANG Zexi, YANG Bin, GUO Xu, YANG Guannan*, ZHANG Yu, HUANG Guanghan, and CUI Chengqiang
Author Affiliations
  • State Key Laboratory of Precision Electronic Manufacturing Technology and Equipment, Guangdong University of Technology, Guangzhou 510006, China
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    WANG Zhanbo, ZHANG Zexi, YANG Bin, GUO Xu, YANG Guannan, ZHANG Yu, HUANG Guanghan, CUI Chengqiang. Regulation Study of Stress Buffer Layer on the Internal Stress and Reliability of Glass Substrate Hole-Filling Structures[J]. Electronics and Packaging, 2025, 25(7): 70103

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Special Issue:

    Received: Feb. 28, 2025

    Accepted: Aug. 26, 2025

    Published Online: Aug. 26, 2025

    The Author Email: YANG Guannan (ygn@gdut.edu.cn)

    DOI:10.16257/j.cnki.1681-1070.2025.0122

    Topics