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Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 4, 317(2025)

Investigation on the test circuit of the dynamic on-state resistance of GaN HEMTs

LIU Mengli, LI Sheng, MA Yanfeng, LIU Siyang*, and SUN Weifeng
Author Affiliations
  • National ASIC System Engineering Research Center, Southeast University, Nanjing Jiangsu 210096, China
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    LIU Mengli, LI Sheng, MA Yanfeng, LIU Siyang, SUN Weifeng. Investigation on the test circuit of the dynamic on-state resistance of GaN HEMTs[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(4): 317

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    Received: May. 8, 2024

    Accepted: May. 29, 2025

    Published Online: May. 29, 2025

    The Author Email: LIU Siyang (liusy2855@163.com)

    DOI:10.11805/tkyda2024223

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology