Piezoelectrics & Acoustooptics, Volume. 47, Issue 3, 465(2025)
Simulation of Non-Destructive Measurement of Geometric Parameters of Multi-Structure Thin Films Using a Single-Port Surface Acoustic Wave Resonator
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LIU Zhuo, XIAO Xia, ZHANG Jinsong, ZHANG Li. Simulation of Non-Destructive Measurement of Geometric Parameters of Multi-Structure Thin Films Using a Single-Port Surface Acoustic Wave Resonator[J]. Piezoelectrics & Acoustooptics, 2025, 47(3): 465
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Received: Feb. 10, 2025
Accepted: --
Published Online: Jul. 11, 2025
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