Laser & Optoelectronics Progress, Volume. 61, Issue 17, 1712006(2024)
Calibration of Structural Parameters of Five-Axis Surface Topography Measurement System for Curved Optics
Fig. 2. Schematic of the overall composition of the five-axis white light interferometric system
Fig. 3. Schematics of coherence scanning interferometry. (a) Schematic of the optical path of the self-developed CSI probe; (b) schematic of PZT longitudinal scanning and camera acquisition during measurement
Fig. 4. Coordinate system establishment diagram of the five-axis white light interferometric system
Fig. 5. Kinematic chain topology of the five-axis white light interferometric system
Fig. 7. Experimental sample. (a) Aspherical calibration part with a diameter of 310 mm; (b) auxiliary alignment spherical sample with a diameter of 13 mm and residual annular knife pattern under a single field of view centered on the crown point of the ball
Fig. 9. Four-point calibration Schematic of an aspheric calibration part with known surface equations
Fig. 10. Eight verification points for calibration accuracy verification experiments
Fig. 11. Error diagram of the calibration accuracy verification experimental results
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Jun Yang, Yijun Shen, Jiayu Liu, Rongxian Wen, Mingjun Ren, Rong Su. Calibration of Structural Parameters of Five-Axis Surface Topography Measurement System for Curved Optics[J]. Laser & Optoelectronics Progress, 2024, 61(17): 1712006
Category: Instrumentation, Measurement and Metrology
Received: Dec. 22, 2023
Accepted: Feb. 5, 2024
Published Online: Sep. 9, 2024
The Author Email: Yijun Shen (sjtu_syj@sjtu.edu.cn), Mingjun Ren (renmj@sjtu.edu.cn), Rong Su (surong@siom.ac.cn)
CSTR:32186.14.LOP232717