Laser & Optoelectronics Progress, Volume. 56, Issue 1, 011004(2019)
Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology
Figures & Tables(6)
Fig. 1. (a) Schematic of subsurface defect of fused silica in fluorescence non-destructive testing; (b) laser damage test optical path of optical elements
Fig. 2. Fluorescence images of subsurface defects of fused silica elements. (a) Ort1; (b) Ort2; (c) Ort3; (d) Ort4; (e) Ort5; (f) Ort6; (g) Ort7
Fig. 3. Curves of laser damage probability and energy density of fused silica optical elements
Table 1. Roughness of fused silica samples
View tableTable 1. Roughness of fused silica samples
Element number Standard / (mm×mm) Roughness R q /nmOrt1 50×30 1.247 Ort2 50×30 0.767 Ort3 50×30 0.647 Ort4 50×30 1.065 Ort5 50×50 1.077 Ort6 50×50 0.577 Ort7 50×50 0.913
Table 2. Fluorescence non-destructive detection statistics
View tableTable 2. Fluorescence non-destructive detection statistics
Element number Defect area /μm Area ratio of defects Ort1 250 1.8×10-4 Ort2 102 4.0×10-5 Ort3 2779 1.1×10-3 Ort4 114 4.5×10-5 Ort5 110 4.3×10-5 Ort6 113 4.4×10-5 Ort7 162 6.3×10-5
Table 3. Zero-probability damage threshold for different fused silica sample
View tableTable 3. Zero-probability damage threshold for different fused silica sample
Element number Threshold /(J·cm-2) Ort1 8.04 Ort2 9.79 Ort3 6.15 Ort4 8.62 Ort5 8.63 Ort6 8.95 Ort7 6.88
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Honglu Li, Hongjie Liu, Xiaodong Jiang, Jin Huang, Linhong Cao. Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology[J]. Laser & Optoelectronics Progress, 2019, 56(1): 011004
Paper Information
Category: Image Processing
Received: Jun. 21, 2018
Accepted: Jul. 18, 2018
Published Online: Aug. 1, 2019
The Author Email: Xiaodong Jiang (jiangxiaodong@163.com), Linhong Cao (hyclh@yeah.net)
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