Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology

Honglu Li; Hongjie Liu; Xiaodong Jiang; Jin Huang; Linhong Cao

doi:10.3788/LOP56.011004

Laser & Optoelectronics Progress, Volume. 56, Issue 1, 011004(2019)

Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology

Honglu Li¹, Hongjie Liu², Xiaodong Jiang^2、*, Jin Huang², and Linhong Cao^1、**

¹ School of Materials Science and Engineering, Southwest University of Science and Technology, Mianyang, Sichuan 621900, China

² Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China

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Honglu Li, Hongjie Liu, Xiaodong Jiang, Jin Huang, Linhong Cao. Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology[J]. Laser & Optoelectronics Progress, 2019, 56(1): 011004

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Paper Information

Category: Image Processing

Received: Jun. 21, 2018

Accepted: Jul. 18, 2018

Published Online: Aug. 1, 2019

The Author Email: Xiaodong Jiang (jiangxiaodong@163.com), Linhong Cao (hyclh@yeah.net)

DOI:10.3788/LOP56.011004

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology