Piezoelectrics & Acoustooptics, Volume. 44, Issue 1, 111(2022)

Control Method of Wafer Test Process Based on GRU Neural Network

GUO Daizong and HU Hong
Author Affiliations
  • [in Chinese]
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    References(7)

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    GUO Daizong, HU Hong. Control Method of Wafer Test Process Based on GRU Neural Network[J]. Piezoelectrics & Acoustooptics, 2022, 44(1): 111

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    Paper Information

    Received: Nov. 1, 2021

    Accepted: --

    Published Online: Mar. 16, 2022

    The Author Email:

    DOI:10.11977/j.issn.1004-2474.2022.01.021

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