Infrared and Laser Engineering, Volume. 54, Issue 8, 20250178(2025)

Measurement and analysis of the scattering characteristics of transparent substrate sheets based on polarization separation

Jiashi YAO1,2, Zhaohui LI2,3、*, Zhen MAO2,3, Wei LIU2, Liang NIE1, Quan ZHOU2, Yong LIU2, and Shasha YIN2
Author Affiliations
  • 1School of Opto-electronical Engineering, Xi'an Technological University, Xi'an 710016, China
  • 2Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
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    Jiashi YAO, Zhaohui LI, Zhen MAO, Wei LIU, Liang NIE, Quan ZHOU, Yong LIU, Shasha YIN. Measurement and analysis of the scattering characteristics of transparent substrate sheets based on polarization separation[J]. Infrared and Laser Engineering, 2025, 54(8): 20250178

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    Paper Information

    Category: 光电测量

    Received: Mar. 17, 2025

    Accepted: --

    Published Online: Aug. 29, 2025

    The Author Email: Zhaohui LI (lizhaohui@opt.ac.cn)

    DOI:10.3788/IRLA20250178

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