Infrared and Laser Engineering, Volume. 54, Issue 8, 20250178(2025)

Measurement and analysis of the scattering characteristics of transparent substrate sheets based on polarization separation

Jiashi YAO1,2, Zhaohui LI2,3、*, Zhen MAO2,3, Wei LIU2, Liang NIE1, Quan ZHOU2, Yong LIU2, and Shasha YIN2
Author Affiliations
  • 1School of Opto-electronical Engineering, Xi'an Technological University, Xi'an 710016, China
  • 2Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(15)
    Schematic diagram of surface scattering and volume scattering
    (a) The polarization angles of surface scattering vary with the incident angle and scattering angle; (b) The polarization angles of volume scattering vary with the incident angle and scattering angle
    Variation of polarization angle with scattering angle at different incident angles. (a) θi=0°; (b) θi=5°; (c) θi=45°; (d) θi=85°
    Logical structure and research approach flowchart
    Schematic diagram of the optical path for surface scattering and volume scattering testing
    Optical path for surface scattering and volume scattering testing
    Volume scattering of transparent substrates with different thicknesses
    Variation trends of surface scattering and volume scattering under different surface roughness
    Measured values of surface scattering and volume scattering
    • Table 1. Measurement results of volume scattering for different substrate materials

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      Table 1. Measurement results of volume scattering for different substrate materials

      MaterialGain levelCalibration voltage/mVVoltage/μVNormalized intensity
      JGS110537.81040.01355.1×10−5
      Corning79790.01094.1×10−5
      ZF90.02198.2×10−5
      Sapphire(Al2O30.00772.9×10−5
    • Table 2. Volume scattering of transparent substrate sheets with different thicknesses

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      Table 2. Volume scattering of transparent substrate sheets with different thicknesses

      Thickness/mmGain levelCalibration voltage/mVVoltage/μVNormalized intensity
      1.510537.81040.00291.08×10−5
      30.00381.42×10−5
      50.00521.94×10−5
    • Table 3. Surface scattering of transparent substrates with different surface roughnesses

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      Table 3. Surface scattering of transparent substrates with different surface roughnesses

      Surface roughness/nmPower/W
      Surface scatteringVolume scattering
      0.11.03×10−81.16×10−5
      0.39.00×10−81.17×10−5
      0.52.50×10−71.19×10−5
      11.00×10−61.25×10−5
      24.00×10−61.51×10−5
      31.30×10−51.95×10−5
      42.32×10−52.58×10−5
      53.62×10−53.36×10−5
      65.22×10−54.36×10−5
      77.10×10−55.51×10−5
      89.28×10−56.83×10−5
      91.07×10−47.07×10−5
      101.12×10−47.37×10−5
    • Table 4. Parameters of the sample sheets

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      Table 4. Parameters of the sample sheets

      MaterialSizeSurface roughnessPV
      SapphireΦ20×3 mm3 nm$ \dfrac{\lambda }{5} $@633 nm
    • Table 5. Data recording and calculation form

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      Table 5. Data recording and calculation form

      $ {\theta }_{i} $/(°)$ {\theta }_{s} $/(°)ΨCalibration voltage/mVVoltageNormalized intensity
      π/2+απ/2+βSurface scattering voltage/mVVolume scattering voltage/mVGain levelπ/2+απ/2+β
      603069.3457.1137.8×1040.003470.00371051.05×10−51.38×10−5
      504072.7058.580.005130.00481051.49×10−51.75×10−5
      434773.0658.730.005600.00531051.62×10−51.92×10−5
      454573.1358.765.542.351046.78×10−28.49×10−2
      474373.0658.730.005940.00501051.72×10−51.82×10−5
      405072.7058.580.005580.00441051.62×10−51.61×10−5
      306069.3457.110.00440.00411051.18×10−51.37×10−5
    • Table 6. Scattering intensity of the sample sheet with a roughness of 0.3 nm and a thickness of 3 mm

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      Table 6. Scattering intensity of the sample sheet with a roughness of 0.3 nm and a thickness of 3 mm

      MaterialThicknessSurface roughnessNormalized intensity
      Sapphire3 mm0.3 nm1.44×10−5
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    Jiashi YAO, Zhaohui LI, Zhen MAO, Wei LIU, Liang NIE, Quan ZHOU, Yong LIU, Shasha YIN. Measurement and analysis of the scattering characteristics of transparent substrate sheets based on polarization separation[J]. Infrared and Laser Engineering, 2025, 54(8): 20250178

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    Paper Information

    Category: 光电测量

    Received: Mar. 17, 2025

    Accepted: --

    Published Online: Aug. 29, 2025

    The Author Email: Zhaohui LI (lizhaohui@opt.ac.cn)

    DOI:10.3788/IRLA20250178

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