Journal of Infrared and Millimeter Waves, Volume. 43, Issue 4, 520(2024)

An improved ASM-HEMT model for kink effect on GaN devices

Shuai WANG1,2, Ai-Qiang CHENG2, Chen GE2, Dun-Jun CHEN1、*, Jun LIU3, and Da-Zhi DING4
Author Affiliations
  • 1Department of Electronic Science and Engineering,Nanjing University,Nanjing 210033,China
  • 2Nanjing Electronic Devices Institute,Nanjing 210016,China
  • 3Department of Electronic Information,Hangzhou Dianzi University,Hangzhou 310018,China
  • 4Department of microelectronics,Nanjing University of Science and Technology,Nanjing 210094,China
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    Figures & Tables(13)
    Current collapse and kink effect in the output characteristics
    Photographs of D-mode GaN HEMTs: (a) the 1.2-mm-wide device;(b) the 0.4-mm-wide device
    The test system
    The fitting result of the output characteristics Ids-Vdsfor the 1.2-mm-wide device: (a) Vds ranges from 0 V to 36 V;(b) Vds ranges from 0 V to 10 V
    The fitting result of the output characteristics Ids-Vds for the 0.4-mm-wide device: (a) Vds ranges from 0 V to 36 V; (b) Vds ranges from 0 V to 10 V
    The fitting result of the S-parameter: (a) the 1.2-mm-wide device; (b) the 0.4-mm-wide device
    The fitting result of the output conductance gds1-Vds
    The fitting result of the transfer characteristics Ids-Vgs
    The fitting result of the transconductance gm1-Vgs
    Schematic diagram of the load-pull simulation in ADS
    Simulated and measured Pout for the maximum power matching and PAE for the maximum efficiency matching
    • Table 1. The extracted parameters related to the current collapse and kink effect for the 1.2-mm-wide device

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      Table 1. The extracted parameters related to the current collapse and kink effect for the 1.2-mm-wide device

      The fitting parameterd0d1g0g1g2g3g4
      Value5.234 m102.50618.15 m69.02 m218.3 m151.4 m
    • Table 2. The extracted parameters related to the current collapse and kink effect for the 0.4-mm-wide device

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      Table 2. The extracted parameters related to the current collapse and kink effect for the 0.4-mm-wide device

      The fitting parameterd0d1g0g1g2g3g4
      Value21.83 m3.7933.282477.5 m584.2 m0.001 m3.451 m
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    Shuai WANG, Ai-Qiang CHENG, Chen GE, Dun-Jun CHEN, Jun LIU, Da-Zhi DING. An improved ASM-HEMT model for kink effect on GaN devices[J]. Journal of Infrared and Millimeter Waves, 2024, 43(4): 520

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    Paper Information

    Category: Research Articles

    Received: Sep. 3, 2023

    Accepted: --

    Published Online: Aug. 27, 2024

    The Author Email: Dun-Jun CHEN (djchen@nju.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2024.04.011

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