Journal of Applied Optics, Volume. 46, Issue 2, 451(2025)

Experimental study of color CCD detector damage by nanosecond laser irradiation

Minghui ZUO, Cuiheng ZHANG, Pin NIE, Di WANG, and Zhi WEI*
Author Affiliations
  • College of Physics, Changchun University of Science and Technology, Changchun 130022, China
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    References(16)

    [1] SABSABI M, HÉON R, ST-ONGE L. Critical evaluation of gated CCD detectors for laser-induced breakdown spectroscopy analysis[J]. Spectrochimica Acta Part B: Atomic Spectroscopy, 60, 1211-1216(2005).

    [6] SHAO Ming, ZHANG Le, ZHANG Leilei et al. Comparative study on saturation effect of 1.06 μm laser jamming CCD and CMOS cameras[J]. Journal of Applied Optics, 35, 163-167(2014).

    [9] TANIGUCHI R, SASAKI R, OKUDA S et al. Noise characteristics of neutron images obtained by cooled CCD device[J]. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 605, 85-90(2009).

    [10] LI G, SHEN H B, LI L et al. Laser-induced damages to charge coupled device detector using a high-repetition-rate and high-peak-power laser[J]. Optics & Laser Technology, 47, 221-227(2013).

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    Minghui ZUO, Cuiheng ZHANG, Pin NIE, Di WANG, Zhi WEI. Experimental study of color CCD detector damage by nanosecond laser irradiation[J]. Journal of Applied Optics, 2025, 46(2): 451

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    Paper Information

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    Received: Dec. 11, 2024

    Accepted: --

    Published Online: May. 13, 2025

    The Author Email: Zhi WEI (魏智)

    DOI:10.5768/JAO202546.0207006

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