A measurement method of film parameters of metal based on imaging ellipsometry and surface-plasmon resonance is presented. p polarized light is applied to generate surface-plasmon resonance effect at the interface of metal film and air in layout of imaging ellipsometry. The influence of back light is avoided by s polarized light which can′ t lead to surface- plasmon resonance effect. Then the normalized reflectance profile along the perpendicular direction of absorption ring of surface- plasmon resonance is obtained. We measure metal film parameters by numerical fitting the reflectance profile along long axis of the elliptical fringe. This method is not necessary to solve the transcendental equation and data processing is simple and fast. The experimental result with this method is coincident with that of standard ellipsometer, which verifies the validity of this measurement method.