Laser & Optoelectronics Progress, Volume. 56, Issue 11, 110003(2019)

Research and Development on Laser Frequency Stabilization Based on Spectral Hole-Burning Effect

Lin Han1、*, Yige Lin2, Jing Yang1, Yingjie Lan1, Ye Li2, Xiaojun Wang1, Yong Bo1, and Qinjun Peng1
Author Affiliations
  • 1 Research Center of Laser Physics and Technology, Key Laboratory of Functional Crystal and Laser Technology, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China
  • 2 Time and Frequency Division, National Institute of Metrology, Beijing 100029, China
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    Figures & Tables(7)
    Diagram of spectral hole-burning
    Diagram of interaction between incident laser and spectral hole-burning. (a) Laser frequency equal to central frequency of spectral hole-burning; (b) laser frequency higher than central frequency of spectral hole-burning; (c) laser frequency lower than central frequency of spectral hole-burning
    Energy-level structure of ions for spectral hole-burning
    Experimental setup of laser frequency stabilization based on spectral hole-burning effect
    Experimental setup of laser frequency stabilization based on spectral hole-burning effect with pre-stabilization on F-P cavity
    • Table 1. Materials for laser frequency stabilization based on spectral hole-burning effect in cryogenic rare-earth-ion-doped crystals

      View table

      Table 1. Materials for laser frequency stabilization based on spectral hole-burning effect in cryogenic rare-earth-ion-doped crystals

      IonLockedwavelength /nmEnergy-level-transitionHostmaterial
      Eu3+5807F05D0Y2SiO5
      Tm3+7933H63H4YAG、CaF2
      Er3+15504I15/24I13/2Y2SiO5
      Pr3+6063H41D2Y2SiO5
    • Table 2. Research progress on laser frequency stabilization based on spectral hole-burning effect in cryogenic rare- earth-ion-doped crystals

      View table

      Table 2. Research progress on laser frequency stabilization based on spectral hole-burning effect in cryogenic rare- earth-ion-doped crystals

      YearTeamLaserStabilizationwavelength /nmSpectral Hole-burningmaterialResultMethod
      1999Montana StateUniversity, USAExternal cavitydiode laser798Tm3+∶CaF2Allandeviation of 780±120 Hzfor 20-50 ms integration timeRef. [19]
      2000Montana StateUniversity, USAExternal cavitydiode lasers793Tm3+∶Y3Al5O12Stabilization to 20 Hz on10 ms time scaleRef. [20]
      2001Montana StateUniversity, USADiode lasers1536Er3+∶Y2SiO5Allandeviation of 500 Hzfor 2 ms integration time drift of7 kHz/min over several minutesRef. [21],[22], [23]
      2002Montana StateUniversity, USADiode lasers1537Er3+∶KTP200 Hz at 1.5 μm and independentto 20 Hz at 793 nm over10 ms integration timeRef. [24]
      2003Montana StateUniversity, USADiode lasers1523Er3+∶D2 ∶CaF2Frequency stability of 2 kHzto 680 Hz over 20 ms to 500 sintegration timeRef. [25]
      2007Lund Institute ofTechnology, SwedenDye lasers606Pr3+∶Y2SiO5Frequency stability of1 kHz over 10 μs time scaletogether with long-term frequencydrift below 1 kHz/sRef. [17]
      2007Montana StateUniversity, USASingle-frequencydiode lasers1530.4Er3+∶LiYF4Allan deviation of 1.5 kHzover 0.05-50 s integration times,with laser frequency drift reducedto less than 1.4 kHz/minRef. [26]
      2011National Instituteof Standards andTechnology, USADye lasers580Eu3+∶Y2SiO5Allan deviation of≤6×10-16 for 2 s≤t≤8 sintegration timeRef. [14]
      2013National Instituteof Standardsand Technology(NIST), USADye lasers580Eu3+∶Y2SiO5Short-term frequencystability of 7×10-16τ-1/2that averages down to@204 s integration timeRef. [28]
      2015National Instituteof Standards andTechnology(NIST), USADye lasers580Eu3+∶Y2SiO5Fractional frequencyinstability of 1×10-15τ-1/2that averages to @73 sintegration timeRef. [39]
      2017PSL ResearchUniversity,FranceExternal cavity diodelasers + frequencydoubling in PPLN580Eu3+∶Y2SiO5Fractional frequencystability of 2×10-14 from1 to 100 s integration timeRef. [40]
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    Lin Han, Yige Lin, Jing Yang, Yingjie Lan, Ye Li, Xiaojun Wang, Yong Bo, Qinjun Peng. Research and Development on Laser Frequency Stabilization Based on Spectral Hole-Burning Effect[J]. Laser & Optoelectronics Progress, 2019, 56(11): 110003

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    Paper Information

    Category: Reviews

    Received: Nov. 22, 2018

    Accepted: Jan. 7, 2019

    Published Online: Jun. 13, 2019

    The Author Email: Lin Han (hanlin@mail.ipc.ac.cn)

    DOI:10.3788/LOP56.110003

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