Laser & Infrared, Volume. 54, Issue 4, 574(2024)
Fault diagnosis of TPA and IAOA-BILSTM circuit chips based on infrared
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WANG Li, ZHU Meng, MA Jang-yan. Fault diagnosis of TPA and IAOA-BILSTM circuit chips based on infrared[J]. Laser & Infrared, 2024, 54(4): 574
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Received: Jun. 5, 2023
Accepted: May. 21, 2025
Published Online: May. 21, 2025
The Author Email: ZHU Meng (1935427533@qq.com)