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Laser & Infrared, Volume. 54, Issue 4, 574(2024)

Fault diagnosis of TPA and IAOA-BILSTM circuit chips based on infrared

WANG Li, ZHU Meng*, and MA Jang-yan
Author Affiliations
  • Airborne Electronic Systems Deep Maintenance Laboratory, College of Vocational Technology, Civil Aviation University of China, Tianjin 300300, China
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    WANG Li, ZHU Meng, MA Jang-yan. Fault diagnosis of TPA and IAOA-BILSTM circuit chips based on infrared[J]. Laser & Infrared, 2024, 54(4): 574

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    Paper Information

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    Received: Jun. 5, 2023

    Accepted: May. 21, 2025

    Published Online: May. 21, 2025

    The Author Email: ZHU Meng (1935427533@qq.com)

    DOI:10.3969/j.issn.1001-5078.2024.04.014

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology