Chinese Optics, Volume. 17, Issue 3, 693(2024)

Design and application of CCD/EMCCD photoelectronic parameter test system

Ji SHEN1、*, VIACHESLAV V. Zabudsky2, Wei-jing CHANG1, Qi-yue NA1, Yun-fei JIAN1, OLEG V. Rikhalsky3, OLEKSANDR G. Golenkov2, and VOLODYMYR P. Reva2
Author Affiliations
  • 1East China Institute of Optoelectronic Integrated Devices, Suzhou 215263, China
  • 2V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, Kyiv 01001, Ukraine
  • 3Bogomoletz Institute of Physiology of NAS of Ukraine, Kyiv 01001, Ukraine
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    Ji SHEN, VIACHESLAV V. Zabudsky, Wei-jing CHANG, Qi-yue NA, Yun-fei JIAN, OLEG V. Rikhalsky, OLEKSANDR G. Golenkov, VOLODYMYR P. Reva. Design and application of CCD/EMCCD photoelectronic parameter test system[J]. Chinese Optics, 2024, 17(3): 693

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    Paper Information

    Category: Original Article

    Received: Jul. 4, 2023

    Accepted: Aug. 28, 2023

    Published Online: Jul. 31, 2024

    The Author Email: Ji SHEN (njustshenji@126.com)

    DOI:10.37188/CO.EN-2023-0016

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