Chinese Optics, Volume. 17, Issue 3, 693(2024)
Design and application of CCD/EMCCD photoelectronic parameter test system
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Ji SHEN, VIACHESLAV V. Zabudsky, Wei-jing CHANG, Qi-yue NA, Yun-fei JIAN, OLEG V. Rikhalsky, OLEKSANDR G. Golenkov, VOLODYMYR P. Reva. Design and application of CCD/EMCCD photoelectronic parameter test system[J]. Chinese Optics, 2024, 17(3): 693
Category: Original Article
Received: Jul. 4, 2023
Accepted: Aug. 28, 2023
Published Online: Jul. 31, 2024
The Author Email: Ji SHEN (njustshenji@126.com)