Researching | A New Scattering Artifact Correction Method Based on K-N Formula for Cone-Beam Computed Tomography

Acta Optica Sinica, Volume. 38, Issue 11, 1134001(2018)

A New Scattering Artifact Correction Method Based on K-N Formula for Cone-Beam Computed Tomography

Jianbang Liu^**, Xiaoqi Xi, Yu Han, Lei Li, Haibing Bu, and Bin Yan^*

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Information System Engineering College, Information Engineering University, Zhengzhou, Henan 450002, China

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CLP Journals

[1] Geng Niu, Junbiao Liu, Weixia Zhao, Li Han, Yutian Ma. Effect of Focused Bombarding Electron Beam on Transmission Microfocus X-Ray Source[J]. Acta Optica Sinica, 2019, 39(6): 0634001

[2] Geng Niu, Junbiao Liu, Weixia Zhao, Li Han, Yutian Ma. Effect of Focused Bombarding Electron Beam on Transmission Microfocus X-Ray Source[J]. Acta Optica Sinica, 2019, 39(6): 0634001

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Jianbang Liu, Xiaoqi Xi, Yu Han, Lei Li, Haibing Bu, Bin Yan. A New Scattering Artifact Correction Method Based on K-N Formula for Cone-Beam Computed Tomography[J]. Acta Optica Sinica, 2018, 38(11): 1134001

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Paper Information

Category: X-Ray Optics

Received: Apr. 9, 2018

Accepted: Jun. 19, 2018

Published Online: May. 9, 2019

The Author Email:

DOI:10.3788/AOS201838.1134001

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology