Acta Optica Sinica, Volume. 38, Issue 11, 1134001(2018)

A New Scattering Artifact Correction Method Based on K-N Formula for Cone-Beam Computed Tomography

Jianbang Liu**, Xiaoqi Xi, Yu Han, Lei Li, Haibing Bu, and Bin Yan*
Author Affiliations
  • Information System Engineering College, Information Engineering University, Zhengzhou, Henan 450002, China
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    Figures & Tables(11)
    Diagram of effect of X-ray on single scattering point
    Scattering correction process flow chart
    Schematic of scattering point setting
    Schematic diagram of simulation system
    Scattering proportion distributions of simple model. (a) Produced by point; (b) produced by line; (c) produced by plane
    Reconstructions of aluminum cylinder. (a) Scattering distribution produced by the aluminum cylinder; (b) result without scattering correction; (c) result with scattering correction; (d) profile of CT values on the red line in Fig. 6 (b)-Fig. 6 (c)
    Projection distributions under different T values. (a) Projection without correction; (b) projection at T=0.3125; (c) projection at T=0.6583; (d) projection at T=0.9470
    Contrast diagrams of correction effect. (a) Correction with BSA; (b) correction with proposed method; (c) CT value in center location with BSA; (d) CT value in center location with proposed method
    Reconstructions of industrial components. (a) Result without scattering correction; (b) result with scattering correction; (c) another layer of image results without correction; (d) another layer of image results with correction; (e) and (f) local magnified images of Fig. 9(c) and Fig. 9(d), respectively; (g) profiles of CT values on the red line in Fig. 9(a) and Fig. 9(b)
    • Table 1. Quantitative analysis of aluminium cylinder

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      Table 1. Quantitative analysis of aluminium cylinder

      CorrectionCNRContrastσTcup/%
      Without scattering correction3.93725.34820.56021.429
      With scattering correction6.07741.90224.2125.063
    • Table 2. Quantitative analysis of the industrial component

      View table

      Table 2. Quantitative analysis of the industrial component

      CorrectionCNRContrastσTcup /%
      Without scattering correction7.35513.306595.563018.5762
      With scattering correction9.39895.0955119.51418.6453
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    Jianbang Liu, Xiaoqi Xi, Yu Han, Lei Li, Haibing Bu, Bin Yan. A New Scattering Artifact Correction Method Based on K-N Formula for Cone-Beam Computed Tomography[J]. Acta Optica Sinica, 2018, 38(11): 1134001

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    Paper Information

    Category: X-Ray Optics

    Received: Apr. 9, 2018

    Accepted: Jun. 19, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/AOS201838.1134001

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