Laser & Optoelectronics Progress, Volume. 52, Issue 1, 11201(2015)
Measurement Investigation of Continuous Wave Terahertz Back Scattering Characteristics in Three Kinds of Background Materials
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Li Qi, Yang Yongfa, Zhao Yongpeng, Chen Deying. Measurement Investigation of Continuous Wave Terahertz Back Scattering Characteristics in Three Kinds of Background Materials[J]. Laser & Optoelectronics Progress, 2015, 52(1): 11201
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Jun. 15, 2014
Accepted: --
Published Online: Nov. 19, 2014
The Author Email: Li Qi (liqi2013@hit.edu.cn)
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