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Laser & Optoelectronics Progress, Volume. 52, Issue 1, 11201(2015)

Measurement Investigation of Continuous Wave Terahertz Back Scattering Characteristics in Three Kinds of Background Materials

Li Qi*, Yang Yongfa, Zhao Yongpeng, and Chen Deying
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    Li Qi, Yang Yongfa, Zhao Yongpeng, Chen Deying. Measurement Investigation of Continuous Wave Terahertz Back Scattering Characteristics in Three Kinds of Background Materials[J]. Laser & Optoelectronics Progress, 2015, 52(1): 11201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 15, 2014

    Accepted: --

    Published Online: Nov. 19, 2014

    The Author Email: Li Qi (liqi2013@hit.edu.cn)

    DOI:10.3788/lop52.011201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology