Fig. 1. Principle diagram of the conical crystal spectrometer.

Fig. 2. Principle diagram of the multi-curvature analyzer.

Fig. 3. X-ray path in the XOZ plane with deviation of reflection point.

Fig. 4. Schematic of the reflection point moving along negative Z axis.

Fig. 5. Fabricated multi-curvature α-quartz crystal on the glass substrate.

Fig. 6. Schematic of the source, bent crystal, and detector.

Fig. 7. X-ray spectrum obtained from the (a) multi-curvature crystal and (b) the planar α-quartz crystal, respectively.

Fig. 8. Distribution of spectral intensity: (a) multi-curvature bent α-quartz crystal, (b) the planar α-quartz crystal.