Chinese Optics Letters, Volume. 18, Issue 11, 113401(2020)

High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal

Jun Shi1, Tong Yao2, Miao Li2、*, Guohong Yang3, Minxi Wei3, Wanli Shang3, and Feng Wang3
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Ministry of Education, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
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    Jun Shi, Tong Yao, Miao Li, Guohong Yang, Minxi Wei, Wanli Shang, Feng Wang, "High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal," Chin. Opt. Lett. 18, 113401 (2020)

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    Paper Information

    Category: X-ray Optics

    Received: May. 14, 2020

    Accepted: Aug. 18, 2020

    Published Online: Sep. 29, 2020

    The Author Email: Miao Li (limiao@cqupt.edu.cn)

    DOI:10.3788/COL202018.113401

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