Laser & Optoelectronics Progress, Volume. 60, Issue 18, 1811013(2023)

Depth-of-Field Extension Technology for Terahertz Self-Mixing Interferometric Imaging

Jiaxuan Cai1, Yan Xie2,3、*, Yang Yu2, Yingxin Wang2,3, Meng Chen3, Ziran Zhao2,3、**, Peng Bai1, Ning Yang1, and Weidong Chu1、***
Author Affiliations
  • 1Institute of Applied Physics and Computational Mathematics, Beijing 100088, China
  • 2Department of Engineering Physics, Tsinghua University, Beijing 100084, China
  • 3National Engineering Research Center of Detection Technology of Dangerous Explosives, Beijing 100084, China
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    Figures & Tables(7)
    Three mirror model of self-mixing
    Imaging schematic of self-mixing interferometer
    Spot intensity distribution after focusing measured by knife-edge method
    Appropriate imaging area selected by simulation of spot size.(a) Simulation of FWHM varing with propagation distance when deviating from the focal plane (z=0); (b) image of 1-1 on resolution board by optical microscope
    Scanning and reconstruction results for 1-1 along x axis. (a) Amplitude under each off-focus plane; (b) reconstruction results under each off-focus plane; (c) result comparison on the focal plane; (d) result comparison on plane 2 mm away to focal plane; (e) result comparison on plane 4 mm away to focal plane
    Amplitude and reconstruction images of 1-1. (a)‒(c) Amplitude images on plane 0, 2, 4 mm away to focal plane; (d)‒(f) reconstruction images on plane 0, 2, 4 mm away to focal plane
    Variation of structural similarity of images with offset distance
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    Jiaxuan Cai, Yan Xie, Yang Yu, Yingxin Wang, Meng Chen, Ziran Zhao, Peng Bai, Ning Yang, Weidong Chu. Depth-of-Field Extension Technology for Terahertz Self-Mixing Interferometric Imaging[J]. Laser & Optoelectronics Progress, 2023, 60(18): 1811013

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    Paper Information

    Category: Imaging Systems

    Received: May. 18, 2023

    Accepted: Jun. 20, 2023

    Published Online: Sep. 19, 2023

    The Author Email: Yan Xie (xie_yan@tsinghua.edu.cn), Ziran Zhao (zhaozr@tsinghua.edu.cn), Weidong Chu (chu_weidong@iapcm.ac.cn)

    DOI:10.3788/LOP231331

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