Depth-of-Field Extension Technology for Terahertz Self-Mixing Interferometric Imaging

Jiaxuan Cai; Yan Xie; Yang Yu; Yingxin Wang; Meng Chen; Ziran Zhao; Peng Bai; Ning Yang; Weidong Chu

doi:10.3788/LOP231331

Laser & Optoelectronics Progress, Volume. 60, Issue 18, 1811013(2023)

Depth-of-Field Extension Technology for Terahertz Self-Mixing Interferometric Imaging

Jiaxuan Cai¹, Yan Xie^2,3、*, Yang Yu², Yingxin Wang^2,3, Meng Chen³, Ziran Zhao^2,3、**, Peng Bai¹, Ning Yang¹, and Weidong Chu^1、***

Author Affiliations

¹Institute of Applied Physics and Computational Mathematics, Beijing 100088, China

²Department of Engineering Physics, Tsinghua University, Beijing 100084, China

³National Engineering Research Center of Detection Technology of Dangerous Explosives, Beijing 100084, China

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Jiaxuan Cai, Yan Xie, Yang Yu, Yingxin Wang, Meng Chen, Ziran Zhao, Peng Bai, Ning Yang, Weidong Chu. Depth-of-Field Extension Technology for Terahertz Self-Mixing Interferometric Imaging[J]. Laser & Optoelectronics Progress, 2023, 60(18): 1811013

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Paper Information

Category: Imaging Systems

Received: May. 18, 2023

Accepted: Jun. 20, 2023

Published Online: Sep. 19, 2023

The Author Email: Yan Xie (xie_yan@tsinghua.edu.cn), Ziran Zhao (zhaozr@tsinghua.edu.cn), Weidong Chu (chu_weidong@iapcm.ac.cn)

DOI:10.3788/LOP231331

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology