Chinese Journal of Lasers, Volume. 30, Issue 5, 445(2003)

Testing of Dynamic Recording Properties for TeOx and Ag-In-Sb-Te-O Thin Films

[in Chinese]*, [in Chinese], and [in Chinese]
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    References(7)

    [1] [1] N. Akahira, T. Ohta, N. Yamada et al.. Sub-oxside thin films for an optical recording disk [C]. SPIE, 1982, 329:195~201

    [2] [2] K. Kimura. Optical recording materials based on TeOx films [J]. Jpn. J. Appl. Phys., 1989, 28(5):810~813

    [3] [3] M. Takenaga, N. Yamada, S. Ohara et al.. New optical erasable medium using tellurium suboxside thin film [C]. SPIE, 1983, 420:173~177

    [4] [4] K. Nishiuchi, H. Kitaura, N. Yamada et al.. Dual-layer optical disk with Te-O-Pb phase -change film [J]. Jpn. J. Appl. Phys., 1998, 37(4B):2163~2167

    [5] [5] Guo-Fu Zhou, Bernardus A. J. Jacobs. High performance media for phase change optical recording [J]. Jpn. J. Appl. Phys., 1999, 38(3B):1625~1628

    [6] [6] Li Qinghui, Gan Fuxi. Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy [J]. Appl. Surf. Sci., 2001, 181(3-4):239~247

    [9] [9] Gan Fuxi (Chief Editor). Digital Optical Disks and Optical Storage Media [M]. Shanghai: Shanghai Science and Technology Press, 1992. 198~207 (in Chinese)

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    [in Chinese], [in Chinese], [in Chinese]. Testing of Dynamic Recording Properties for TeOx and Ag-In-Sb-Te-O Thin Films[J]. Chinese Journal of Lasers, 2003, 30(5): 445

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    Paper Information

    Category: measurement and metrology

    Received: Feb. 8, 2002

    Accepted: --

    Published Online: Jun. 27, 2006

    The Author Email: (qinghuil@sina.com)

    DOI:

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