Chinese Journal of Lasers, Volume. 30, Issue 5, 445(2003)
Testing of Dynamic Recording Properties for TeOx and Ag-In-Sb-Te-O Thin Films
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[in Chinese], [in Chinese], [in Chinese]. Testing of Dynamic Recording Properties for TeOx and Ag-In-Sb-Te-O Thin Films[J]. Chinese Journal of Lasers, 2003, 30(5): 445
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