The recordable disks using TeO x thin films as the recording medium and the erasable disks using Ag In Sb Te O thin films as the recording medium were fabricated by the methods of vacuum evaporation and by the method of sputtering, respectively. Dynamic recording properties of the two kinds of disks at 514 5 nm were reported. The carrier to noise ratio (CNR) of the recordable disk could reach about 30 dB at 514 5 nm and 41 dB at 780 nm ; that of the erasable disk could reach about 25 dB at 514 5 nm and 38dB at 780 nm. The reasons which caused the low CNR were discussed. The two kinds of films had the potential for using as blue green short wavelength high density optical storage media.