Journal of Infrared and Millimeter Waves, Volume. 41, Issue 5, 856(2022)

Millimeter wave Schottky diode characterization and on-wafer measurement

Ao ZHANG1,2 and Jian-Jun GAO3、*
Author Affiliations
  • 1School of Transportation and Civil Engineering,Nantong University,Nantong 226019,China
  • 2Key Laboratory of Polar Materials and Devices,Ministry of Education,East China Normal University,Shanghai 200241,China
  • 3School of Physics and Electronic Science,East China Normal University,Shanghai 200241,China
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    References(15)

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    [9] Torkhov N A, Babak L I, Kokolov A. A Compact Model of Planar Schottky Diode with Anode Pin in a Form of Air Bridge with Whisker[C], 1-4(2018).

    [10] Nadri S, Moore C M, Sauber N D et al. Thermal Characterization of Quasi-Vertical GaAs Schottky Diodes Integrated on Silicon[J]. IEEE Transactions on Electron Devices, 66, 349-356(2019).

    [11] HUANG H L, HUANG J, SHI Q. A parameter extraction method of the Schottky diode millimeter wave equivalent circuit model[J]. J. Infrared Millim. Waves, 40, 732-737(2021).

    [12] Champlin K S, Eisenstein G. Cutoff frequency of submillimeter Schottky barrier diodes[J]. IEEE Transactions on Microwave Theory and Techniques, 26, 31-34(1978).

    [13] Zhang A, Gao J. A new method for determination of PAD capacitances for GaAs HBTs based on scalable small signal equivalent circuit model[J]. Solid State Electronics, 150, 45-50(2018).

    [14] ZHANG A, ZHANG Y X, WANG B R et al. An approach to determine small-signal model parameters for InP HBT up to 110 GHz[J]. J. Infrared Millim. Waves, 37, 688-692(2018).

    [15] Morales H, Dunleavy L, Skidmore S. Ultra-broadband characterization of Schottky diodes[C], 1-4(2012).

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    Ao ZHANG, Jian-Jun GAO. Millimeter wave Schottky diode characterization and on-wafer measurement[J]. Journal of Infrared and Millimeter Waves, 2022, 41(5): 856

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    Paper Information

    Category: Research Articles

    Received: Jan. 20, 2022

    Accepted: --

    Published Online: Feb. 6, 2023

    The Author Email: Jian-Jun GAO (jjgao@ee.ecnu.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2022.05.009

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