Journal of Infrared and Millimeter Waves, Volume. 41, Issue 5, 856(2022)
Millimeter wave Schottky diode characterization and on-wafer measurement
Fig. 2. Surface channel planar diode (a) cross section (b) SEM image
Fig. 4. Quasi-vertical diode fabricated by University of Virginia [10]
Fig. 5. Intrinsic small-signal equivalent circuit model of Schottky diode
Fig. 6. Simplified equivalent circuit model of Schottky diode under full-conducting biased conduction (a) and zero bias conduction (b)
Fig. 8. Cutoff frequency versus parasitic resistance and zero bias intrinsic capacitance
Fig. 9. The schematic diagram of the one-port S-parameters measurement method (a) and on-chip test structure (b)
Fig. 10. Equivalent circuit model of Schottky diode for one-port S-parameters measurement
Fig. 11. Extracted parasitic inductance and capacitance based on the one-port S-parameters measurement
Fig. 12. Comparison between modeled and measured S-parameters of one-port S-parameters measurement(Frequency range:1~110 GHz)
Fig. 13. The schematic diagram of the two-port series S-parameters measurement method (a) and on-chip test structure (b)
Fig. 14. Equivalent circuit model of Schottky diode for two-port S-parameters measurement
Fig. 15. Extracted parasitic inductance and capacitance values based on the two-port S-parameters measurement
Fig. 16. Comparison between modeled and measured S-parameters (Frequency range:1~75 GHz) (a) Current=10 mA (b) Current=0.1 mA
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Ao ZHANG, Jian-Jun GAO. Millimeter wave Schottky diode characterization and on-wafer measurement[J]. Journal of Infrared and Millimeter Waves, 2022, 41(5): 856
Category: Research Articles
Received: Jan. 20, 2022
Accepted: --
Published Online: Feb. 6, 2023
The Author Email: Jian-Jun GAO (jjgao@ee.ecnu.edu.cn)