Journal of Infrared and Millimeter Waves, Volume. 41, Issue 5, 856(2022)

Millimeter wave Schottky diode characterization and on-wafer measurement

Ao ZHANG1,2 and Jian-Jun GAO3、*
Author Affiliations
  • 1School of Transportation and Civil Engineering,Nantong University,Nantong 226019,China
  • 2Key Laboratory of Polar Materials and Devices,Ministry of Education,East China Normal University,Shanghai 200241,China
  • 3School of Physics and Electronic Science,East China Normal University,Shanghai 200241,China
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    Figures & Tables(18)
    The schematic diagram of GaAs Schottky diode structure
    Surface channel planar diode (a) cross section (b) SEM image
    Air-bridge planar diode (a) cross section (b) SEM image
    Quasi-vertical diode fabricated by University of Virginia [10]
    Intrinsic small-signal equivalent circuit model of Schottky diode
    Simplified equivalent circuit model of Schottky diode under full-conducting biased conduction (a) and zero bias conduction (b)
    Cutoff frequency of Schottky diodes
    Cutoff frequency versus parasitic resistance and zero bias intrinsic capacitance
    The schematic diagram of the one-port S-parameters measurement method (a) and on-chip test structure (b)
    Equivalent circuit model of Schottky diode for one-port S-parameters measurement
    Extracted parasitic inductance and capacitance based on the one-port S-parameters measurement
    Comparison between modeled and measured S-parameters of one-port S-parameters measurement(Frequency range:1~110 GHz)
    The schematic diagram of the two-port series S-parameters measurement method (a) and on-chip test structure (b)
    Equivalent circuit model of Schottky diode for two-port S-parameters measurement
    Extracted parasitic inductance and capacitance values based on the two-port S-parameters measurement
    Comparison between modeled and measured S-parameters (Frequency range:1~75 GHz) (a) Current=10 mA (b) Current=0.1 mA
    • Table 1. Extracted model parameter based on the one-port S-parameters measurement

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      Table 1. Extracted model parameter based on the one-port S-parameters measurement

      参数0 mA3.6 mA
      Cp/fF1414
      Lp/pH2828
      Ls/pH55
      Rs44
      Cj/fF10-
      Rj-8
    • Table 2. Extracted model parameter based on the two-port S-parameters measurement

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      Table 2. Extracted model parameter based on the two-port S-parameters measurement

      参数100 μA10 mA
      Cp/fF3535
      Lp/pH7575
      Ls/pH4545
      Rs44
      Cj/fF25-
      Rj-10
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    Ao ZHANG, Jian-Jun GAO. Millimeter wave Schottky diode characterization and on-wafer measurement[J]. Journal of Infrared and Millimeter Waves, 2022, 41(5): 856

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    Paper Information

    Category: Research Articles

    Received: Jan. 20, 2022

    Accepted: --

    Published Online: Feb. 6, 2023

    The Author Email: Jian-Jun GAO (jjgao@ee.ecnu.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2022.05.009

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