Infrared and Laser Engineering, Volume. 51, Issue 9, 20220500(2022)

High-precision profile measurement method for axisymmetric aspheric mirror (invited)

Xinrui Fan1,2, Xiaofei Diao3、*, Jianwei Wu1,2, and Yanhui Kang3
Author Affiliations
  • 1Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China
  • 2Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin 150080, China
  • 3National Institute of Metrology, Beijing 100029, China
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    Figures & Tables(11)
    Schematic diagram of the optical probe normal tracking trajectory
    Schematic diagram of coordinate scanning device with separate metrology frames
    Schematic diagram of optical probe interference principle
    Positioning and measuring principle of scanning mechanism
    Non-contact scanning measurement device
    Image of reflector under test
    Measurement errors of ϕ25 mm standard ball
    Measurement standard deviation ofϕ25 mm standard ball
    Measurement errors of aspheric mirror
    Measurement standard deviation of aspheric mirror
    • Table 1. Characteristic parameters of different non-contact scanning probes

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      Table 1. Characteristic parameters of different non-contact scanning probes

      Probe typeResolutionRangeCharacteristics
      Differential confocal10 nm (Vertical resolution)Micron-scaleMust be matched with the actuator to increase the range, and increased sources of errors
      Dispersion confocal0.5 nm (Vertical resolution)Micron-scale
      White-light interference<0.1 nm (Vertical resolution)Micron-scale
      Multi-wavelength interferenceSub-nanometerMillimeter-scaleLarge working distance
      Self-focused sensing0.2 μmMillimeter-scaleLarge working distance but insufficient precision
      Laser triangulation2 μmMillimeter-scale
      Scanning tunnel microscope5 nm<1 nmLow scanning efficiency and only metal parts can be measured
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    Xinrui Fan, Xiaofei Diao, Jianwei Wu, Yanhui Kang. High-precision profile measurement method for axisymmetric aspheric mirror (invited)[J]. Infrared and Laser Engineering, 2022, 51(9): 20220500

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    Paper Information

    Category: Special issue—Ultra precision manufacture and testing technology of optical aspheric surface

    Received: Jul. 21, 2022

    Accepted: --

    Published Online: Jan. 6, 2023

    The Author Email: Diao Xiaofei (diaoxf@nim.ac.cn)

    DOI:10.3788/IRLA20220500

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