Infrared and Laser Engineering, Volume. 51, Issue 9, 20220500(2022)
High-precision profile measurement method for axisymmetric aspheric mirror (invited)
Fig. 1. Schematic diagram of the optical probe normal tracking trajectory
Fig. 2. Schematic diagram of coordinate scanning device with separate metrology frames
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Xinrui Fan, Xiaofei Diao, Jianwei Wu, Yanhui Kang. High-precision profile measurement method for axisymmetric aspheric mirror (invited)[J]. Infrared and Laser Engineering, 2022, 51(9): 20220500
Category: Special issue—Ultra precision manufacture and testing technology of optical aspheric surface
Received: Jul. 21, 2022
Accepted: --
Published Online: Jan. 6, 2023
The Author Email: Diao Xiaofei (diaoxf@nim.ac.cn)