Infrared and Laser Engineering, Volume. 51, Issue 11, 20210144(2022)

High-precision optical measurement method based on discrete path and splicing

Zhengxiang Shen1,2, Xu Wang1,2, and Jun Yu1,2
Author Affiliations
  • 1Key Laboratory of Advanced Micro-Structure Materials, Ministry of Education, Tongji University, Shanghai 200092, China
  • 2Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
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    Figures & Tables(15)
    (a) The circular scanning path; (b) The radial scanning path
    Schematic diagram of splicing measurement
    The principle of data compensation
    Simulation results of environmental error suppression method
    Schematic diagram of uniform circular path distribution
    Schematic diagram of experimental device
    Chromatic confocal probe with vertical adjustable mount
    The measured surface. (a) Nickel flat mirror with diameter of 60 mm; (b) Interferometer test results
    Shape error of circular path measurement
    Shape error after suppress environmental error
    Shape deviation before and after suppress
    Comparison of the RMS value of the surface shape before and after suppression
    • Table 1. Performance test of the lathe

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      Table 1. Performance test of the lathe

      Performance testResult
      X-axis horizontal straightness/μm 0.129
      X-axis vertical straightness/μm 0.360
      Z-axis horizontal straightness/μm 0.063
      Z-axis vertical straightness/μm 0.753
      X-Zaxes squareness/(″) 0.486
      C-axis motion error (radial)/μm 7.21
      C-axis motion error (axial)/nm 6.58
      C-axis positioning accuracy/(″) 0.60
    • Table 2. Parameters of the probe

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      Table 2. Parameters of the probe

      ParameterSpecification
      Measuring range/μm300
      Working distance/mm4.5
      Resolution/nm3
      Spot diameter/μm5
      Lateral resolution/μm2.5
      Numerical aperture0.5
      Measurement angle/(°)90±30
      Measuring accuracy/μm0.1
      Reproducibility/nm30
    • Table 3. Experimental data

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      Table 3. Experimental data

      UnsuppressedSuppressedInterferometer
      RMS value/μm0.1740.1460.140
      Standard deviation/μm0.0060.009-
      Deviation from interferometer/μm 0.0340.006-
      Relative error24.3%4.3%-
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    Zhengxiang Shen, Xu Wang, Jun Yu. High-precision optical measurement method based on discrete path and splicing[J]. Infrared and Laser Engineering, 2022, 51(11): 20210144

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    Paper Information

    Category: Photoelectric measurement

    Received: Mar. 9, 2021

    Accepted: --

    Published Online: Feb. 9, 2023

    The Author Email:

    DOI:10.3788/IRLA20210144

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