Fig. 1. SEM images of silver nanoparticle arrays after thermal annealing at 450 ℃. (a) Thick silver film is 4 nm; (b) thick silver film is 6 nm; (c) thick silver film is 8 nm

Fig. 2. SEM images of silver nanoparticle arrays formed from silver films with different deposition thickness after annealing at different temperatures. (a) 4 nm, 450 ℃; (b) 4 nm, 500 ℃; (c) 4 nm, 550 ℃; (d) 6 nm, 450 ℃; (e) 6 nm, 500 ℃; (f) 6 nm, 550 ℃

Fig. 3. Silver nanoparticle arrays with 4 nm and 6 nm thick silver deposition films under controllable annealing temperature. (a) Average particle size; (b) average density distribution; (c) average gap size

Fig. 4. Measured reflectance and transmittance of the silver nanoparticle arrays formed after annealing of silver films with different thicknesses. (a) Reflectance at 4 nm; (b) transmittance at 4 nm; (c) reflectance at 6 nm; (d) transmittance at 6 nm

Fig. 5. Normalized absorption and scattering spectra of silver nanoparticles arrays formed after annealing of silver thin films with different thicknesses calculated by far field numerical transformation. (a) Normalized absorption spectrum at 4 nm; (b) normalized absorption spectrum at 6 nm; (c) normalized scattering spectrum at 4 nm; (d) normalized scattering spectrum at 6 nm

Fig. 6. Normalized extinction spectra of silver nanoparticle arrays formed by annealing silver thin films with different thicknesses after numerical transformation. (a) 4 nm; (b) 6 nm