Laser & Optoelectronics Progress, Volume. 54, Issue 10, 100201(2017)
Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
Hu Xiaotao, Hao Xiaojian, Duan Xianggang. Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra[J]. Laser & Optoelectronics Progress, 2017, 54(10): 100201
Paper Information
Category: Atomic and Molecular Physics
Received: May. 15, 2017
Accepted: --
Published Online: Oct. 9, 2017
The Author Email: Hu Xiaotao (635499244@qq.com)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20