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Laser & Optoelectronics Progress, Volume. 54, Issue 10, 100201(2017)

Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra

Hu Xiaotao*, Hao Xiaojian, and Duan Xianggang
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    Article index updated: Sep. 7, 2025

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    Hu Xiaotao, Hao Xiaojian, Duan Xianggang. Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra[J]. Laser & Optoelectronics Progress, 2017, 54(10): 100201

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    Paper Information

    Category: Atomic and Molecular Physics

    Received: May. 15, 2017

    Accepted: --

    Published Online: Oct. 9, 2017

    The Author Email: Hu Xiaotao (635499244@qq.com)

    DOI:10.3788/lop54.100201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology